Light-modulated scanning tunneling spectroscopy for nanoscale imaging of surface photovoltage

Takeuchi, Osamu; Yoshida, Shoji; Shigekawa, Hidemi
May 2004
Applied Physics Letters;5/3/2004, Vol. 84 Issue 18, p3645
Academic Journal
Light-modulated scanning tunneling spectroscopy (LM–STS) is proposed as a useful method for investigating spatially resolved surface photovoltage (SR–SPV). LM–STS provides the dependences of SR–SPV on bias voltage under constant tip-sample distance simultaneously with the entire dark/illuminated I–V curves. With this method, it is shown that SPV of a metallic Si(111) surface can be bias-dependent and SPV at zero bias voltage for Si(001) can be tip-sample-distance-dependent under conditions of small tip-sample distance and high illumination intensity. The importance of the experimental condition for interpreting experimentally obtained SR–SPV was suggested. © 2004 American Institute of Physics.


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