Interfacial free volumes and segregation effects in nanocrystalline Pd85Zr15 studied by positron annihilation

Weigand, H.; Sprengel, W.; Röwer, R.; Schaefer, H.-E.; Wejrzanowski, T.; Kelsch, M.
April 2004
Applied Physics Letters;4/26/2004, Vol. 84 Issue 17, p3370
Academic Journal
Positron annihilation spectroscopy on nanocrystalline Pd85Zr15 shows the segregation of Zr at the interfaces and a decrease of the fraction of nanovoids the size of 10 to 15 missing atoms upon isochronal annealing up to Ta=1100 K by which the grain size increases up to d=185 nm. In this state, the positron trapping at interfacial free volumes reversibly changes contingent upon the temperature whereas the interfacial composition is unchanged when the measuring temperature varies. © 2004 American Institute of Physics.


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