Vertically aligned conductive carbon nanotube junctions and arrays for device applications

Biswas, Sujit K.; Vajtai, Robert; Wei, Bingqing; Meng, Guowen; Schowalter, Leo J.; Ajayan, Pulickel M.
April 2004
Applied Physics Letters;4/12/2004, Vol. 84 Issue 15, p2889
Academic Journal
Electrical transport through high-density arrays of carbon nanotubes grown within vertical pores of anodized alumina was measured. Individual nanotubes were studied using conductive tip atomic force microscopy, with bias applied between the tip and platinum back electrode. Multiwalled nanotubes of diameter about 50 nm, with 5 nm thick walls were found to have a resistivity lower than 1.4×10-5 Ω m. A potential barrier was found to exist between the sensing tip and nanotube, resulting in nonlinear current–voltage characteristics. Low-resistance contact was formed by breaking down this barrier, once the circuit was stressed beyond 1.5 V. © 2004 American Institute of Physics.


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