Microsecond time scale lateral-mode dynamics in a narrow stripe InGaN laser

Eichler, Christoph; Hofstetter, Daniel; Chow, Weng W.; Miller, Stephan; Weimar, Andreas; Lell, Alfred; Härle, Volker
April 2004
Applied Physics Letters;4/5/2004, Vol. 84 Issue 14, p2473
Academic Journal
Time-resolved measurements of the spectrum and the far field of InGaN-based laser diodes show lateral-mode changes and gradual tilting of the far field on a microsecond time scale. Numerical simulations based on a microscopic theory are in good agreement with the measurements. The observed effects are attributed to lateral carrier diffusion in combination with thermal lensing. © 2004 American Institute of Physics.


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