TITLE

Crossover between extrinsic and intrinsic dielectric loss mechanisms in SrTiO[sub 3] thin films at microwave frequencies

AUTHOR(S)
Astafiev, K.F.; Sherman, V.O.; Tagantsev, A.K.; Setter, N.; Kaydanova, T.; Ginley, D.S.
PUB. DATE
March 2004
SOURCE
Applied Physics Letters;3/29/2004, Vol. 84 Issue 13, p2385
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The dc bias field dependence of the dielectric loss in SrTiO[sub 3] thin films deposited onto MgO substrate is investigated. The experimental data obtained at different frequencies of the ac field (8 and 16 GHz) from differently processed films (as deposited and oxygen annealed) strongly suggest the occurrence of a crossover in the dominant loss mechanism. The crossover is driven by the dc bias field: at weak fields the loss is governed by an extrinsic mechanism(s) whereas, at higher fields, the contribution of an intrinsic mechanism (dc field-induced quasi-Debye loss) becomes predominant. © 2004 American Institute of Physics.
ACCESSION #
12606838

 

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