Thermoelectric anisotropy and texture of intercalated TiS2

Guilmeau, E.; Barbier, T.; Maignan, A.; Chateigner, D.
September 2017
Applied Physics Letters;9/25/2017, Vol. 111 Issue 13, p133903-1
Academic Journal
This study addresses the effect of anisotropy on the electrical and thermal properties of CuxTiS2 compounds. We show that the anisotropy of the electrical resistivity (ρcross-plane/ρin-plane> 1) tends to be reduced as the covalent character along c is increased with the Cu content. For all x values (x≤0.1), the absolute value of S is always found to be higher in-plane than in the cross-plane direction due to band structure anisotropy, leading to higher in-plane power factor values. Interestingly, the κin-plane/κcross-plane thermal conductivity ratio, with values similar to the only data reported for TiS2 crystals, are always higher than ρcross-plane/ρin-plane. This anisotropy relation leads to equivalent zT values for the in-plane and cross-plane directions, reaching 0.35–0.5 at 800K.


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