Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

Lacour, D.; Katine, J.A.; Folks, L.; Block, T.; Childress, J.R.; Carey, M.J.; Gurney, B.A.
March 2004
Applied Physics Letters;3/15/2004, Vol. 84 Issue 11, p1910
Academic Journal
The presence of a domain wall trapped by a submicron notch is probed in two ways: through electronic transport measurements and by magnetic force microscopy (MFM). MFM data, exhibiting complex magnetic features, are consistent with numerical simulations predicting the existence of multiple magnetic configurations stabilized at the notch. By changing the MFM scanning history we demonstrate experimentally the existence of multiple stable locations for a domain wall trapped by a submicron notch. © 2004 American Institute of Physics.


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