TITLE

Single virus particle mass detection using microresonators with nanoscale thickness

AUTHOR(S)
Gupta, A.; Akin, D.; Bashir, R.
PUB. DATE
March 2004
SOURCE
Applied Physics Letters;3/15/2004, Vol. 84 Issue 11, p1976
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In this letter, we present the microfabrication and application of arrays of silicon cantilever beams as microresonator sensors with nanoscale thickness to detect the mass of individual virus particles. The dimensions of the fabricated cantilever beams were in the range of 4–5 μm in length, 1–2 μm in width and 20–30 nm in thickness. The virus particles we used in the study were vaccinia virus, which is a member of the Poxviridae family and forms the basis of the smallpox vaccine. The frequency spectra of the cantilever beams, due to thermal and ambient noise, were measured using a laser Doppler vibrometer under ambient conditions. The change in resonant frequency as a function of the virus particle mass binding on the cantilever beam surface forms the basis of the detection scheme. We have demonstrated the detection of a single vaccinia virus particle with an average mass of 9.5 fg. These devices can be very useful as components of biosensors for the detection of airborne virus particles. © 2004 American Institute of Physics.
ACCESSION #
12512660

 

Related Articles

  • Apertureless near-field optical microscopy with differential and close-proximity detection. Fukuzawa, Kenji; Tanaka, Yuriko // Applied Physics Letters;7/14/1997, Vol. 71 Issue 2, p169 

    Develops an apertureless near-field scanning optical microscopy (NSOM) using differential and proximate detection. Illustration of the NSOM principle; Specification of the laterally differential detection using a microfabricated photosensitive cantilever; Indication of NSOM ability to detect...

  • An impedance based non-contact feedback control system for scanning probe microscopes. Lee, Mark; McDaniel, E.B.; Hsu, J.W.P. // Review of Scientific Instruments;Apr96, Vol. 67 Issue 4, p1468 

    Describes a non-contact, non-optical distance feedback control system for scanning probe microscopes that detects the surface damping of a vibrating probe. Derivation of the feedback signal; Incorporation of an arbitrary-impedance bridge by the system; Improvement of the reliability.

  • Measurement of fluid properties with a near-field acoustic sensor. Patois, R.; Vairac, P. // Applied Physics Letters;7/12/1999, Vol. 75 Issue 2, p295 

    Proposes a microsensor derived from the electromechanical resonator of the scanning microdeformation microscope (SMM). Replacement of the SMM tip by a submillimetric spherical probe immersed in the fluid sample.

  • A fast scanning probe for DIII–D. Watkins, J. G.; Salmonson, J.; Moyer, R.; Doerner, R.; Lehmer, R.; Schmitz, L.; Hill, D. N. // Review of Scientific Instruments;Oct92, Vol. 63 Issue 10, p4728 

    A fast reciprocating probe has been developed for DIII-D which can penetrate the separatrix during H mode with up to 5 MW of NBI heating. The probe has been designed to carry various sensor tips into the scrape-off layer at a velocity of 3 m/s and dwell motionless for a programmed period of...

  • Scanning shearing-stress microscope. Sasaki, A.; Katsumata, A.; Iwata, F.; Aoyama, H. // Applied Physics Letters;1/3/1994, Vol. 64 Issue 1, p124 

    Develops a scanning probe microscope based on a scanning tunneling microscope (STM). Improvement of the frequency shift of an AT cut quartz resonator; Oscillation of the quartz resonator coupled to an STM sample; Changes of subsurface shearing stresses in gold thin films.

  • Microfabrication of Silicon/Ceramic Hybrid Cantilever for Scanning Probe Microscope and Sensor Applications. Wakayama, Takayuki; Kobayashi, Toshinari; Iwata, Nobuya; Tanifuji, Nozomi; Matsuda, Yasuaki; Yamada, Syoji // AIP Conference Proceedings;2003, Vol. 696 Issue 1, p264 

    We present here new cantilevers for scanning probe microscopy (SPM) and sensor applications, which consist of silicon cantilever beam and ceramic pedestal. Silicon is only used to make cantilever beams and tips. Precision-machinery-made ceramics replaces silicon pedestal part. The ceramics was...

  • Scanning frequency mixing microscopy of high-frequency transport behavior at electroactive interfaces. Rodriguez, Brian J.; Jesse, Stephen; Meunier, Vincent; Kalinin, Sergei V. // Applied Physics Letters;4/3/2006, Vol. 88 Issue 14, p143128 

    An approach for high-frequency transport imaging, referred to as scanning frequency mixing microscopy (SFMM), is developed. Application of two high-frequency bias signals across an electroactive interface results in a low-frequency component due to interface nonlinearity. The frequency of a...

  • Sensors for scanning probe microscopy. Kassing, R.; Rangelow, I.W.; Oesterschulze, E.; Stuke, M. // Applied Physics A: Materials Science & Processing;2003, Vol. 76 Issue 6, p907 

    Scanning probe microscopy is still suffering from reproducible fabrication of the corresponding sensors for mechanical, electrical, optical, thermal and chemical material characterisation with highest lateral and/or time resolution. For batch-fabrication techniques lithographic, dry etching and...

  • Bimorph-driven x–y–z translation stage for scanned image microscopy. Matey, J. R.; Crandall, R. S.; Brycki, B.; Briggs, G. A. D. // Review of Scientific Instruments;Apr87, Vol. 58 Issue 4, p567 

    We have developed an x-y-z scanning stage for mechanically scanned microscopy. The stage is constructed of "double-S" mode piezoelectric bimorphs. The prototype unit has a deflection seasitivity of 0.3 µm/V and a travel in each of the three axes of ± 60 µm. The lowest mechanical...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics