TITLE

Recombination of drifting holes with trapped electrons in stabilized a-Se photoconductors: Langevin recombination

AUTHOR(S)
Kasap, S.O.; Fogal, Bud; Kabir, M. Zahangir; Johanson, Robert E.; O'Leary, Stephen K.
PUB. DATE
March 2004
SOURCE
Applied Physics Letters;3/15/2004, Vol. 84 Issue 11, p1991
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Stabilized amorphous selenium (a-Se) is one of the x-ray photoconductors that is currently used in recently developed direct conversion flat panel x-ray image detectors. We have studied the recombination of free holes with trapped electrons in stabilized a-Se. Electrons were deeply trapped in a-Se by carrying out repetitive electron time-of-flight (TOF) transient photoconductivity experiments. By using conventional and interrupted field hole time-of-flight (IFTOF) transient photoconductivity techniques in a TOF, IFTOF, TOF sequence, we were able to develop a technique that allows the measurement of the capture coefficient between free holes and trapped electrons. We find that the capture process of holes by trapped electrons closely follows the Langevin recombination mechanism. © 2004 American Institute of Physics.
ACCESSION #
12512655

 

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