Torsional spring constant obtained for an atomic force microscope cantilever

Jeon, Sangmin; Braiman, Yehuda; Thundat, Thomas
March 2004
Applied Physics Letters;3/8/2004, Vol. 84 Issue 10, p1795
Academic Journal
In this letter, a method to measure the torsional spring constant of a microcantilever is described. The cantilever was twisted laterally without any normal load by inducing the Lorentz force. An electrical current was applied to the cantilever in a magnetic field, and the torsional resonance frequency of the cantilever was obtained. Based on the observation that the torsional resonance frequency is the same as the second resonance peak of the thermally vibrating cantilever, the ratio of deflection spring constant to torsional spring constant is easily obtained from a simple relationship. For the cantilever used here, the torsional spring constant is 11.24 N/m, 28 times greater than the deflection spring constant. © 2004 American Institute of Physics.


Related Articles

  • Real-time atomic force microscopy using mechanical resonator type scanner. Seo, Yongho; Choi, C. S.; Han, S. H.; Han, Seung-Jin // Review of Scientific Instruments;Oct2008, Vol. 79 Issue 10, p103703 

    The real-time atomic force microscope for biological sample is a challenging research field. We have demonstrated a real-time atomic force microscope by implementing a mechanical resonator type scanner called by “microscanner” The microscanner was designed to have a resonance...

  • Detection of nanomechanical vibrations by dynamic force microscopy in higher cantilever eigenmodes. San Paulo, Alvaro; Black, Justin P.; White, Richard M.; Bokor, Jeffrey // Applied Physics Letters;7/30/2007, Vol. 91 Issue 5, p053116 

    The authors present a method based on dynamic force microscopy to characterize subnanometer-scale mechanical vibrations in resonant micro- and nanoelectromechanical systems. The method simultaneously employs the first eigenmode of the microscope cantilever for topography imaging and the second...

  • Coupling of cantilever lateral bending and torsion in torsional resonance and lateral excitation modes of atomic force microscopy. Yaxin Song; Bhushan, Bharat // Journal of Applied Physics;5/1/2006, Vol. 99 Issue 9, p094911 

    Torsional resonance (TR) mode and lateral excitation (LE) mode of atomic force microscopy (AFM) have been increasingly used in atomic and nanoscale surface imaging. In TR and LE modes, it is the changes of the cantilever dynamic characteristics caused by tip-sample interaction that reveal...

  • Torsional resonance atomic force microscopy in water. Mullin, Nic; Hobbs, Jamie // Applied Physics Letters;2/4/2008, Vol. 92 Issue 5, p053103 

    An atomic force microscope for use in liquids including water, in which a torsionally resonating microcantilever controls the tip-sample interaction, is presented. Magnetostrictive actuators made from a particulate composite of Terfenol-D are used to excite the torsional oscillations of the...

  • Atomic force microscope for operation in high magnetic fields at millikelvin temperatures. Pelekhov, D.V.; Becker, J.B.; Nunes Jr., G. // Review of Scientific Instruments;Jan1999, Vol. 70 Issue 1, p114 

    Describes the design and performance of an atomic force microscope which operates at temperatures down to 20 millikelvin and in magnetic fields up to 9 T. Scan range at low temperatures; Features of the instrument; Ability to detect single atomic steps on a graphite surface; Ability to locate...

  • Atomic force microscope with magnetic force modulation. Florin, Ernst-Ludwig; Radmacher, Manfred; Fleck, Bernhard; Gaub, Hermann E. // Review of Scientific Instruments;Mar94, Vol. 65 Issue 3, p639 

    We have constructed a scanned stylus atomic force microscope (AFM) with direct force modulation and integrated microfluorescence optics. The instrument was designed to image the surface of massive samples under various ambient conditions. In force modulation microscopy the imaging force is...

  • Image processing for resonance frequency mapping in atomic force modulation microscopy. Arinéro, R.; Lévêque, G.; Girard, P.; Ferrandis, J. Y. // Review of Scientific Instruments;Feb2007, Vol. 78 Issue 2, p023103 

    It has been demonstrated that the resonance frequency of the cantilever in atomic force modulation microscopy can be used to study local mechanical properties. We developed a numerical method to achieve mapping of the resonance frequency without significant modification of the device. By making...

  • Excitation of atomic force microscope cantilever vibrations by a Schottky barrier. Schwarz, K.; Rabe, U.; Hirsekorn, S.; Arnold, W. // Applied Physics Letters;5/5/2008, Vol. 92 Issue 18, p183105 

    We have developed a method to excite cantilever vibrations for dynamic force microscopy. A n-doped silicon cantilever is coated by platinum. At the interface, a Schottky barrier forms whose depletion layer couples to the elastic strain mainly by Maxwell stress and by electrostriction. If a...

  • Detection of self-oscillations of the transport current in a doubly connected superconductor. Bondarenko, S. I.; Koverya, V. P.; Krevsun, A. V.; Levchenko, N. M.; Shablo, A. A. // Low Temperature Physics;Feb2010, Vol. 36 Issue 2, p159 

    It has been found experimentally that when dc current is passed through a circuit consisting of two superconductors connected in parallel and reaches its critical value in one of the circuit branches the current in the branches undergoes quasi-harmonic undamped oscillations. The mechanism...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics