Switchable cantilever for a time-of-flight scanning force microscope

DongWeon Lee, B.; Wetzel, Adrian; Bennewitz, Roland; Meyer, Ernst; Despont, Michel; Vettiger, Peter; Gerber, Christoph
March 2004
Applied Physics Letters;3/1/2004, Vol. 84 Issue 9, p1558
Academic Journal
We have developed a cantilever device for applying a time-of-flight scanning force microscope (TOF–SFM) system. The cantilever device consists of a switchable cantilever with an integrated bimorph actuator, an integrated extraction electrode to minimize the ion extraction voltage, and an interlocking structure for precise tip–EE alignment. The TOF–SFM with the cantilever device allows quasisimultaneous topographical and chemical analyses of solid surfaces to be performed in the same way as with the conventional scanning probe technique. The switching properties of the bimorph actuator are demonstrated for use in two operating systems. Field emission measurements and a TOF analysis of a Pt-coated tip are conducted with the TOF–SFM. © 2004 American Institute of Physics.


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