Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry

Schubert, M.; Bundesmann, C.; v. Wenckstern, H.; Jakopic, G.; Haase, A.; Persson, N.-K.; Zhang, F.; Arwin, H.; Inganäs, O.
February 2004
Applied Physics Letters;2/23/2004, Vol. 84 Issue 8, p1311
Academic Journal
Charge redistribution in organic/inorganic heterojunction between poly(3,4-ethylenedioxy thiophene)/poly(styrenesulfonate) polymer (PEDOT/PSS) is observed contact-less by infrared spectroscopic ellipsometry. Hole accumulation or depletion layer formation is detected according to the different work functions of n- and p-type silicon. Dielectric function, optical conductivity, sheet resistance, and vibration modes at wave numbers from 300 to 3000 cm-1 are determined for PEDOT/PSS thin films. We propose use of infrared ellipsometry for investigation of structure and free-charge-carrier properties in layered polymer device heterostructures. © 2004 American Institute of Physics.


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