Direct transport imaging in planar structures

Haegel, N.M.; Fabbri, J.D.; Coleman, M.P.
February 2004
Applied Physics Letters;2/23/2004, Vol. 84 Issue 8, p1329
Academic Journal
Direct imaging of transport behavior between planar contacts has been demonstrated in a scanning electron microscope, using an optical microscope and a high sensitivity charge coupled device to image the motion of free carriers in epitaxial GaAs. After generating charge at a fixed point, subsequent transport can be observed by imaging carrier recombination. Results as a function of applied electric field show excellent agreement to predicted Bessel function distributions for combined drift and diffusion from a point source. The approach can be applied to any luminescent material and allows for direct observation of transport across contacts and other internal boundaries. © 2004 American Institute of Physics.


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