Propagation loss measurement for surface plasmon-polariton modes at metal waveguides on semiconductor substrates

Goto, Touichiro; Katagiri, Yoshitada; Fukuda, Hiroshi; Shinojima, Hiroyuki; Nakano, Yoshiaki; Kobayashi, Ikutaro; Mitsuoka, Yasuyuki
February 2004
Applied Physics Letters;2/9/2004, Vol. 84 Issue 6, p852
Academic Journal
Propagation losses were measured for surface plasmon-polariton (SPP) modes at metal waveguides on semiconductor substrates. The waveguides are simple strips of Au or Al deposited on InP substrates or 300-nm-thick SiO[sub 2] film covering the InP substrates. We used a direct method that can clearly discriminate SPP modes in vidicon-camera images, thereby allowing quantitative measurements. The loss coefficients measured at a wavelength of 1.55 μm were, as predicted by theory, in the range of 8.5–17 dB/mm, which shows the waveguides are feasible for practical applications. © 2004 American Institute of Physics.


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