Optical properties of Cd[sub 1-x]Mg[sub x]Te (x=0.00, 0.23, 0.31, and 0.43) alloy films

Ihn, Y. S.; Kim, T. J.; Kim, Y. D.; Aspnes, D. F.; Kossut, J.
February 2004
Applied Physics Letters;2/2/2004, Vol. 84 Issue 5, p693
Academic Journal
Pseudodielectric functions 〈[variant_greek_epsilon]〉 of Cd[sub 1-x]Mg[sub x]Te ternary alloy films of compositions x=0.00, 0.23, 0.31, and 0.43 have been determined from 1.5 to 6.0 eV by spectroscopic ellipsometry. We obtain approximations to the bulk dielectric functions [variant_greek_epsilon] by performing wet-chemical etching to remove overlayers and using parametric modeling to remove interference oscillations below the fundamental band gap. The values of the E[sub 0], E[sub 0]+Δ[sub 0], E[sub 1], E[sub 1]+Δ[sub 1], E[sub 2], and E[sub 0][sup ′] critical point energies and their x dependences at room temperature were determined from numerically calculated second energy derivatives of these data. © 2004 American Institute of Physics.


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