Deep ultraviolet scanning near-field optical microscopy for the structural analysis of organic and biological materials

Aoki, Hiroyuki; Hamamatsu, Toyohiro; Ito, Shinzaburo
January 2004
Applied Physics Letters;1/19/2004, Vol. 84 Issue 3, p356
Academic Journal
Scanning near-field optical microscopy (SNOM) using a deep ultraviolet (DUV) light source was developed for in situ imaging of a variety of chemical species without staining. Numerous kinds of chemical species have a carbon–carbon double bond or aromatic group in their chemical structure, which can be excited at the wavelength below 300 nm. In this study, the wavelength range available for SNOM imaging was extended to the DUV region. DUV–SNOM allowed the direct imaging of polymer thin films with high detection sensitivity and spatial resolution of several tens of nanometers. In addition to the polymer materials, we demonstrated the near-field imaging of a cell without using a fluorescence label. © 2004 American Institute of Physics.


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