TITLE

Ge dots self-assembling: Surfactant mediated growth of Ge on SiGe (118) stress-induced kinetic instabilities

AUTHOR(S)
Berbezier, I.; Ronda, A.; Portavoce, A.; Motta, N.
PUB. DATE
December 2003
SOURCE
Applied Physics Letters;12/8/2003, Vol. 83 Issue 23, p4833
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The ordering of islands on naturally or artificially nanostructured surfaces is one of the most recent objectives among actual nanotechnology challenges. We show in this letter that, by a combination of two approaches, i.e., a two-step molecular beam epitaxy (MBE) deposition process and surfactant-mediated growth, we are able to obtain chains of nicely ordered ultrasmall islands of lateral size below 50 nm. The two-step MBE process consists of vicinal Si(001) surface self-patterning by SiGe growth instability and Ge dot ordering by subsequent Ge deposition on a SiGe template layer. The surfactant-mediated growth consists of submonolayer Sb deposition prior to Ge growth, in order to reduce the island size up to 25 nm. The best ordering of Ge islands is obtained when the island size matches the wavelength of the template layer. © 2003 American Institute of Physics.
ACCESSION #
11567895

 

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