Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition

Goletti, C.; Bussetti, G.; Chiaradia, P.; Sassella, A.; Borghesi, A.
November 2003
Applied Physics Letters;11/17/2003, Vol. 83 Issue 20, p4146
Academic Journal
Reflectance anisotropy spectroscopy (RAS) has been employed to study in situ the growth of thin α-sexithiophene films by organic molecular beam deposition onto an organic substrate. A large anisotropy can be detected by following the line shape evolution of the RAS spectrum; in addition, the signal variation at a fixed wavelength is used to monitor the film growth. The signal intensity scales with the deposited thickness, demonstrating a very high sensitivity of RAS to less than 1/50 of a monolayer. Evidence of the advantages of RAS to monitor in real time the growth of molecular films and to probe in situ their properties is therefore obtained. © 2003 American Institute of Physics.


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