TITLE

Atomic-scale depth selectivity of soft x-ray resonant Kerr effect

AUTHOR(S)
Ki-Suk Lee, Masanori; Sang-Koog Kim; Kortright, J. B.
PUB. DATE
November 2003
SOURCE
Applied Physics Letters;11/3/2003, Vol. 83 Issue 18, p3764
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
By the use of resonant soft x-ray Kerr rotation measurements with its varying incident angle and energy, we observed various shifts of the exchange bias field of a 3.5-nm-thick Co layer in oppositely exchange-biased Ni[sub 81]Fe[sub 19]/Fe[sub 50]Mn[sub 50]/Co/Pd films. The results in conjunction with their model simulations clearly reveal that the measurements enable one to resolve varying magnetization with depth in the individual magnetic layers of such a multicomponent ultrathin layered structure on the atomic scales. Significant interference effects combined with penetration depth of resonant soft x rays, which are closely associated with their absorptive and refractive contributions, offer remarkably different depth sensitivities into the Kerr effects depending on grazing angle and resonance energy. © 2003 American Institute of Physics.
ACCESSION #
11210005

 

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