TITLE

Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers

AUTHOR(S)
Kuhnke, K.; Hoffmann, D. M. P.; Wu, X. C.; Bittner, A. M.; Kern, K.
PUB. DATE
November 2003
SOURCE
Applied Physics Letters;11/3/2003, Vol. 83 Issue 18, p3830
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We demonstrate molecule-specific imaging of a chemically patterned self-assembled monolayer by IR-visible sum-frequency microscopy. The pattern on an Au substrate consists of microcontact printed 10 μm wide alkanethiolate stripes embedded in ω-carboxyalkanethiolate adsorbed from solution. We use both electronic and vibrational contrast mechanisms for a quantitative analysis of thiolate density and the coverage of the two molecular species. The evaluation of images taken at three different IR wavelengths suggests a substantial intermixing of the two thiolates occuring in the preparation procedure. © 2003 American Institute of Physics.
ACCESSION #
11209983

 

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