Origin of nondetectable x-ray diffraction peaks in nanocomposite CuTiZr alloys

Jiang, J. Z.; Kato, H.; Ohsuna, T.; Saida, J.; Inoue, A.; Saksl, K.; Franz, H.; Ståhl, K.
October 2003
Applied Physics Letters;10/20/2003, Vol. 83 Issue 16, p3299
Academic Journal
Microscopic structures of Cu[sub 60]Ti[sub 10+x]Zr[sub 30-x] (x=0 and 10) alloys have been investigated by transmission electron microscopy, x-ray diffraction (XRD) and differential scanning calorimeter (DSC). In the Cu[sub 60]Ti[sub 10]Zr[sub 30] samples annealed at 708 K for times ranging from 0 to 130 min, where the enthalpy of the first exothermic peak decreases by 80%, the corresponding XRD patterns still look similar to that for the as-prepared sample. However, the simulated XRD patterns for the pure Cu[sub 51]Zr[sub 14] phase, which is the crystalline phase formed during the first exothermic reaction, with small grain sizes and defects clearly show a broadened amorphous-like feature. This might be the reason that no diffraction peaks from the nanocrystalline component were detected in the XRD patterns recorded for the as-cast or as-spun Cu[sub 60]Ti[sub 10+x]Zr[sub 30-x] (x=0 and 10) alloys and for the alloys annealed at lower temperatures, in which the enthalpy of the first exothermic peak has a significant reduction. The second exothermic peak found in DSC curves is due to the formation of another hexagonal phase, spacing group P6[sub 3]/mmc (194) and lattice parameters a=5.105 Å and c=8.231 Å. © 2003 American Institute of Physics.


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