Evidence for two-phase regions in Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3] thin films from capacitance–voltage data

Jiang, A.Q.; Scott, J.F.; Sinnamon, L.J.; Gregg, J.M.
October 2003
Applied Physics Letters;10/20/2003, Vol. 83 Issue 16, p3359
Academic Journal
The Curie–Weiss plots of reciprocal dielectric constant versus temperature, in Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3] films grown onto SrRuO[sub 3] lower electrodes by pulsed-laser deposition, show two minima below film thicknesses of 280 nm. This double minima implies possible mixed phases in the thin films. A graphical plot of capacitance for decreasing dc voltage versus that of increasing dc voltage shows a well-defined triangular shape for both Pb(Zr[sub 0.4]Ti[sub 0.6])O[sub 3] and SrBi[sub 2]Ta[sub 2]O[sub 9] thin films. However, for a 175-nm-thick Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3] thin film, the plot shows an overlapping of two triangles, suggesting mixed phases. This graphical method appears to be effective in detecting structural subtleties in ferroelectric capacitors. © 2003 American Institute of Physics.


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