TITLE

Characterization of atomic force microscope probes at low temperatures

AUTHOR(S)
Radenovic, Alexandra; Bystrenova, Eva; Libioulle, Laurent; Valle, Francesco; Schubeita, George T.; Kasas, Sandor; Dietler, Giovanni
PUB. DATE
September 2003
SOURCE
Journal of Applied Physics;9/15/2003, Vol. 94 Issue 6, p4210
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Characterizes different types of atomic force microscopy probes under ultrahigh vacuum conditions and at low temperatures. Dependence of the properties of AFM probes on temperature; Observation of a shift in the resonance frequency as a function of temperature for all kinds of cantilevers studied.
ACCESSION #
11028821

 

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