Characterization of atomic force microscope probes at low temperatures

Radenovic, Alexandra; Bystrenova, Eva; Libioulle, Laurent; Valle, Francesco; Schubeita, George T.; Kasas, Sandor; Dietler, Giovanni
September 2003
Journal of Applied Physics;9/15/2003, Vol. 94 Issue 6, p4210
Academic Journal
Characterizes different types of atomic force microscopy probes under ultrahigh vacuum conditions and at low temperatures. Dependence of the properties of AFM probes on temperature; Observation of a shift in the resonance frequency as a function of temperature for all kinds of cantilevers studied.


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