Up and Down Atomic Steps

January 2015
SCIENCE First Hand;2015, Vol. 40 Issue 1, p82
The article focuses on the surfaces of crystalline silicon taken from reflection electron microscope (REM). Topics discussed include steps in the image caused by crystallographic planes that have increased atomic density, creation of ultrahigh vacuum (UHV) around surface to observe atomic steps through REM, and information on the development of REm with the help of transmission electron microscope (TEM).


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