Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

Vancura, T.; Kicin, S.; Ihn, T.; Ensslin, K.; Bichler, M.; Wegscheider, W.
September 2003
Applied Physics Letters;9/29/2003, Vol. 83 Issue 13, p2602
Academic Journal
A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in a Ga[Al]As heterostructure. At different separations between atomic force microscope tip and sample, a dc voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. Using a plate capacitor model, the local electron density can be extracted from the data. The result coincides within 10% with the data obtained from transport measurements. © 2003 American Institute of Physics.


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