Observation of domain walls in PbZr[sub 0.2]Ti[sub 0.8]O[sub 3] thin film using scanning nonlinear dielectric microscopy

Matsuura, K.; Cho, Y.; Ramesh, R.
September 2003
Applied Physics Letters;9/29/2003, Vol. 83 Issue 13, p2650
Academic Journal
Using scanning nonlinear dielectric microscopy (SNDM), we measured the linear dielectric constant of a domains (c axis in the plane of the film) and c domains (c axis perpendicular to the film surface) in PbZr[sub 0.2]Ti[sub 0.8]O[sub 3] (PZT) thin film to confirm that the dielectric constant of the a domain is higher than that of the c domain. We observed 90° a–c domain walls and 180° c–c domain walls and found that, experimentally, the 180° c–c domain wall was smaller than the 90° a–c domain wall. © 2003 American Institute of Physics.


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