Potential imaging of pentacene organic thin-film transistors

Nichols, J. A.; Gundlach, D. J.; Jackson, T. N.
September 2003
Applied Physics Letters;9/22/2003, Vol. 83 Issue 12, p2366
Academic Journal
Scanning Kelvin probe microscopy (SKPM) has been used to simultaneously obtain high-resolution topographical and potential images of pentacene organic thin-film transistors (OTFTs) during device operation. SKPM images of OTFTs show large potential drops at the source with the magnitude dependent on contact metallurgy and relatively small potential drops at grain boundaries in polycrystalline pentacene films. © 2003 American Institute of Physics.


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