TITLE

Potential imaging of pentacene organic thin-film transistors

AUTHOR(S)
Nichols, J. A.; Gundlach, D. J.; Jackson, T. N.
PUB. DATE
September 2003
SOURCE
Applied Physics Letters;9/22/2003, Vol. 83 Issue 12, p2366
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Scanning Kelvin probe microscopy (SKPM) has been used to simultaneously obtain high-resolution topographical and potential images of pentacene organic thin-film transistors (OTFTs) during device operation. SKPM images of OTFTs show large potential drops at the source with the magnitude dependent on contact metallurgy and relatively small potential drops at grain boundaries in polycrystalline pentacene films. © 2003 American Institute of Physics.
ACCESSION #
10848411

 

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