Atomic force microscope laser illumination effects on a sample and its application for transient spectroscopy

Buh, G. H.; Kopanski, J. J.
September 2003
Applied Physics Letters;9/22/2003, Vol. 83 Issue 12, p2486
Academic Journal
The effect of illumination from the laser of an optical-beam-deflection atomic force microscope (AFM) on a semiconductor sample is monitored with a (connected in parallel) scanning capacitance microscope (SCM). The photoexcitation of carriers in a silicon sample is quantified using the SCM measured capacitance–voltage curves. A significant difference is seen between SCM capacitance–voltage characteristics measured under true-dark and normal (illuminated) conditions, and is attributed to light spillage over the edges of the AFM cantilever and light transmission through the cantilever. We developed a light-induced transient spectroscopy through simple modification of a commercial SCM and demonstrate it as a tool for the measurement of carrier lifetime with microscopic scale. © 2003 American Institute of Physics.


Related Articles

  • Nonlinear analysis of Electrostatic Force Microscopy. Dianoux, R.; Martins, F.; Marchi, F.; Alandi, C.; Comin, F.; Chevrier, J. // AIP Conference Proceedings;2003, Vol. 696 Issue 1, p955 

    In a search to control charge injection and detection with an atomic force microscope, dynamic force curves are investigated in the presence of an electrostatic tip-sample coupling. An analytical study, using a plane capacitor model, provides results in good agreement with experimental data, in...

  • Damping Contribution in the Interaction between Probe and Ligand-Stabilized Clusters in NC-AFM. Radu, G.; Hartmann, U. // AIP Conference Proceedings;2003, Vol. 696 Issue 1, p899 

    Monolayers of ligand-stabilized Au55 clusters deposited on a mica substrate were investigated by non-contact atomic force microscopy (NC-AFM) and spectroscopy. NC-AFM images exhibit disordered cluster monolayers with pores of varying size showing the bare substrate. Frequency-shift and...

  • Force spectroscopy of single multidomain biopolymers: A master equation approach. Braun, O.; Seifert, U. // European Physical Journal E -- Soft Matter;Sep2005, Vol. 18 Issue 1, p1 

    Experiments using atomic force microscopy for unfolding single multidomain biopolymers cover a broad range of time scales from equilibrium to non-equilibrium. A master equation approach allows to identify and treat coherently three dynamical regimes for increasing linear ramp velocity: i) an...

  • Nonconstant piezo velocity in highly dynamic atomic force spectroscopy. Semin, Benoı⁁t; Guriyanova, Svetlana; Bonaccurso, Elmar // Review of Scientific Instruments;Nov2006, Vol. 77 Issue 11, p116107 

    In this Note we examine six atomic force microscopes or similar instruments for the measurement of surface forces, and we find that they suffer in various degrees from a nonideal performance of the piezo scanner during the acquisition of force curves. This is negligible at low scanning speeds...

  • Unfolding pathways of native bacteriorhodopsin depend on temperature. Janovjak, Harald; Kessler, Max; Oesterhelt, Dieter; Gaub, Hermann; Müller, Daniel J. // EMBO Journal;10/1/2003, Vol. 22 Issue 19, p5220 

    The combination of high-resolution atomic force microscopy (AFM) imaging and single-molecule forcespectroscopy was employed to unfold single bacteriorhodopsins (BR) from native purple membrane patches at various physiologically relevant temperatures. The unfolding spectra reveal detailed insight...

  • Effect of calcination and pH value on the structural and optical properties of titanium oxide thin films. Zayim, E. O. // Journal of Materials Science;Mar2005, Vol. 40 Issue 6, p1345 

    Titanium oxide thin films on glass and silicon wafer substrates were prepared by the sol-gel process. The pH variation and the calcination effect on the optical and structural properties of the films were systematically examined. The coated films were characterized by atomic-force microscopy...

  • Variation of sidewall roughness of polymeric waveguides during reactive ion etching. Pani, S. K.; Wong, C. C.; Sudharsanam, K. // Applied Physics Letters;8/16/2004, Vol. 85 Issue 7, p1295 

    Sidewall roughness (SWR) of fluorinated polyether waveguides fabricated using reactive ion etching was directly measured using atomic force microscopy. We confirmed the pressure dependence of SWR for shallow structures and discovered an additional etch depth dependence for deeper structures...

  • Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts. Lucas, Marcel; Zhong Lin Wang; Riedo, Elisa // Applied Physics Letters;8/3/2009, Vol. 95 Issue 5, p051904 

    We present a method, polarized Raman (PR) spectroscopy combined with atomic force microscopy (AFM), to characterize in situ and nondestructively the structure and the physical properties of individual nanostructures. PR-AFM applied to individual ZnO nanobelts reveals the interplay between growth...

  • Interdiffusion of Indium in piezoelectric InGaAs/GaAs quantum wells grown by molecular beam epitaxy on (11n) substrates. Yee-Rendón, C. M.; Pérez-Centeno, A.; Meléndez-Lira, M.; Gonzalez de la Cruz, G.; López-López, M.; Furuya, Kazuo; Vaccaro, Pablo O. // Journal of Applied Physics;10/1/2004, Vol. 96 Issue 7, p3702 

    Pseudomorphic In0.2Ga0.8As/GaAs quantum wells (QWs) were grown by molecular beam epitaxy on GaAs substrates oriented along s11nd directions, with n=1,2,3,4. The optical and structural properties of the heterostructures were studied by photoluminescence (PL), photoreflectance (PR) spectroscopy,...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics