Birefringence of GaN/AlGaN optical waveguides

Hui, R.; Wan, Y.; Li, J.; Jin, S. X.; Lin, J. Y.; Jiang, H. X.
September 2003
Applied Physics Letters;9/1/2003, Vol. 83 Issue 9, p1698
Academic Journal
We have experimentally studied the birefringence of wurtzite GaN grown on a sapphire substrate. The measurements were done with single-mode GaN/AlGaN planar optical waveguides on c-plane grown heterostructure films. The refractive indices were found to be different for signal optical field perpendicular or parallel to the crystal c axis (n[sub ⊥]≠n[sub ∥]). More importantly, we found an approximately 10% change in index difference Δn=n[sub ∥]-n[sub ⊥] with variation of the waveguide orientation in the a–b plane, and a 60° periodicity was clearly observed. This is attributed to the hexagonal structure of nitride materials. © 2003 American Institute of Physics.


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