TITLE

Response to “Comment on ‘Intrinsic electron transport properties of carbon nanotube Y junctions’ ” [Appl. Phys. Lett. 83, 1674 (2003)]

AUTHOR(S)
Meuniera, Vincent; Nardelli, Marco Buongiorno; Bernholc, J.Z; Zacharia, Thomas; Charlier, Jean-Christophe
PUB. DATE
August 2003
SOURCE
Applied Physics Letters;8/25/2003, Vol. 83 Issue 8, p1676
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The article reports on the intrinsic electronic transport properties of carbon nanotube Y junctions. By separating the intrinsic properties of the conductor and the effect of its contact to metallic leads, researchers showed that a symmetric Y junction does not display a potential rectifying behavior. More precisely, results demonstrated the critical role played by these contacts in the rectification process. It has been shown that the electrical properties of junctions between a semiconducting carbon nanotube and a metallic lead dominate the overall electrical characteristics of nanotube-based field-effect transistors. In order to focus on properties of the conductor itself, one usually relies on modeling. Fortunately, theoretical methods conveniently offer the possibility to separate effects of intrinsic properties of the conductor from effects of its connection to metallic leads.
ACCESSION #
10603799

 

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