Near-field scanning microwave microscope using a dielectric resonator

Kim, Jooyoung; Lee, Kiejin; Friedman, Barry; Cha, Deokjoon
August 2003
Applied Physics Letters;8/4/2003, Vol. 83 Issue 5, p1032
Academic Journal
We describe a near-field scanning microwave microscope which uses a high-quality dielectric resonator with a tunable screw. The operating frequency is f = 4.5 GHz. The probe tip is mounted in a cylindrical resonant cavity coupled to a dielectric resonator for the TE[SUB011] mode. We tuned the resonance cavity to match the impedance of 50 Ω by using a tunable screw and could improve sensitivity and spatial resolution to better than 1 μm. To demonstrate the ability of local microwave characterization, the surface resistance dependence of the metallic thin films on film thickness has been mapped.


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