TITLE

Femtosecond electron diffraction for direct measurement of ultrafast atomic motions

AUTHOR(S)
Cao, J.; Hao, Z.; Park, H.; Tao, C.; Kau, D.; Blaszczyk, L.
PUB. DATE
August 2003
SOURCE
Applied Physics Letters;8/4/2003, Vol. 83 Issue 5, p1044
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have developed a femtosecond electron diffraction system capable of directly measuring the complete transient structures with atomic level detail and on 400-fs time scale in solid materials. Additionally, a diffraction image with significant signal-to-noise ratio to reveal the long-range order can be obtained with a single electron pulse of 700 fs in duration. A direct observation of ultrafast lattice expansion following the irradiation of femtosecond pulsed laser of Ag film has been demonstrated.
ACCESSION #
10404882

 

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