TITLE

Description of an x-ray microscope with 30 nm resolution

AUTHOR(S)
Medenwaldt, Robin; Uggerhoj, Erik
PUB. DATE
August 1998
SOURCE
Review of Scientific Instruments;Aug1998, Vol. 69 Issue 8, p2974
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents an x-ray microscope (XM) with a 30 nanometer resolution. Optical setup of the full-field imaging XM; Performance of the x-ray micrograph; Variables hindering the construction of the XM.
ACCESSION #
1034460

 

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