TITLE

Elastic–stiffness mapping by resonance-ultrasound microscopy with isolated piezoelectric oscillator

AUTHOR(S)
Ogi, Hirotsugu; Tian, Jiayong; Tada, Toyokazu; Hirao, Masahiko
PUB. DATE
July 2003
SOURCE
Applied Physics Letters;7/21/2003, Vol. 83 Issue 3, p464
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A resonance-ultrasound microscopy has been developed for mapping a material's elastic constant in a localized surface region. It detects the effective elastic modulus through a resonance frequency of free vibrations of a solid probe touching the specimen via a small tungsten-carbide bearing. Langasite La[SUB3]Ga[SUB5]SiO[SUB14]) crystal is used as a probe because of the low sensitivity of its elastic constants to temperature and its high piezoelectric coefficients. The vibration of the probe is excited and detected with a surrounding solenoid coil. This noncontacting acoustic coupling isolates the probe vibration and measures the resonance frequency with an accuracy better than one part in 10[SUP5]. This microscopic method is applied to a composite material consisting of silicon-carbide (SiC) fibers in titanium-alloy matrix. The stiffness distribution inside a single fiber was determined.
ACCESSION #
10281611

 

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