TITLE

Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data

AUTHOR(S)
Renault, P.-O.; Le Bourhis, E.; Villain, P.; Goudeau, Ph.; Badawi, K. F.; Faurie, D.
PUB. DATE
July 2003
SOURCE
Applied Physics Letters;7/21/2003, Vol. 83 Issue 3, p473
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The elastic constants (compliances s[SUBij]) of a textured anisotropic thin film deposited on a substrate have been determined. Using x-ray diffraction to measure the intragranular strain and a tensile machine to deform in situ the samples, an analytical method is described and has been developed for fiber textured thin films. The determination of thin film compliances only requires the knowledge of the substrate elastic constants. In the case of a 260-nm-thin gold film, the compliances were found to be slightly different from the corresponding bulk material ones.
ACCESSION #
10281608

 

Related Articles

  • X-ray absorption spectroscopy study of FePt thin films. Martins, A.; Souza-Neto, N. M.; Fantini, M. C. A.; Santos, A. D.; Prado, R. J.; Ramos, A. Y. // Journal of Applied Physics;7/1/2006, Vol. 100 Issue 1, p013905 

    Equiatomic FePt thin films with fcc or L10 structure were studied by x-ray-absorption spectroscopy. The extended x-ray-absorption fine structure and x-ray-absorption near edge structure analysis, sensitive to the local structure and chemical order, show the formation of a Fe-rich neighborhood...

  • Anisotropic strains and magnetoresistance of La[sub 0.7]Ca[sub 0.3]MnO[sub 3]. Koo, T.Y.; Park, S.H. // Applied Physics Letters;8/18/1997, Vol. 71 Issue 7, p977 

    Examines magnetoresistance and anisotropic strains of La[sub 0.7]Ca[sub 0.3]MnO[sub 3] thin films. Use of x-ray diffraction for microscopic structural analysis; Differences in the shapes of thin film cells; Impact of lattice distortion on magnetoresistance.

  • Study of stacking fault effect on magnetic anisotropy of CoPtCr–SiO2 perpendicular media by synchrotron radiation x-ray diffraction. Kubo, T.; Kuboki, Y.; Tanuma, R.; Saito, A.; Watanabe, S.; Shimatsu, T. // Journal of Applied Physics;4/15/2006, Vol. 99 Issue 8, p08G911 

    Thin films of CoPtCr and CoPtCr–SiO2, perpendicular magnetic media materials, were investigated by synchrotron radiation grazing-incidence x-ray diffraction. The analysis of diffraction peaks in a reciprocal space provided the variation of stacking faults as functions of Pt content in...

  • Effects of substrate on the structure and orientation of ZnO thin film grown by rf-magnetron sputtering. Liu, H. F.; Chua, S. J.; Hu, G. X.; Gong, H.; Xiang, N. // Journal of Applied Physics;Oct2007, Vol. 102 Issue 8, p083529 

    X-ray diffractions, Nomarski microscopy, scanning electron microscopy, and photoluminescence have been used to study the effects of substrate on the structure and orientation of ZnO thin films grown by rf-magnetron sputtering. GaAs(001), GaAs(111), Al2O3(0002) (c-plane), and...

  • EPITAXIAL TiN THIN FILMS GROWN ON BIAXIALLY TEXTURED Ni-W SUBSTRATES. Pato, R. A.; Gabor, M. S.; Petrisor Jr., T.; Negrea, G.; Petrisor, T. // Studia Universitatis Babes-Bolyai, Physica;Jun2012, Vol. 57 Issue 1, p67 

    In this paper we present a detailed structural study of epitaxial TiN thin films deposited on biaxially textured Ni- 5%at.W (NiW) substrates by reactive magnetron sputtering. NiW substrates are used as a base material in coated conductors manufacturing. TiN is used as a buffer layer between NiW...

  • Structural and optical properties of PbS thin films grown by chemical bath deposition. Seghaier, S.; Kamoun, N.; Guasch, C.; Zellama, K. // AIP Conference Proceedings;9/19/2007, Vol. 935 Issue 1, p143 

    Lead sulphide thin films are grown on glass substrates at various deposition times tD, in the range of 40–60 min per step of 2 min, using the chemical bath deposition technique. X-ray diffraction and atomic force microscopy are used to characterize the film structure. The surface...

  • The effect of strain induced by Ag underlayer on saturation magnetization of partially ordered Fe16N2 thin films. Yang, Meiyin; Allard, Lawrence F.; Ji, Nian; Zhang, Xiaowei; Yu, Guang-Hua; Wang, Jian-Ping // Applied Physics Letters;12/9/2013, Vol. 103 Issue 24, p242412 

    Partially ordered Fe-N thin films were grown by a facing target sputtering process on the surface of a (001) Ag underlayer on MgO substrates. It was confirmed by x-ray diffraction that the Ag layer enlarged the in-plane lattice of the Fe-N thin films. Domains of the ordered α″-Fe16N2...

  • STUDY OF OPTICAL AND CRYSTALLOGRAPHIC PROPERTIES OF CBD GROWN CDS THIN FILMS. Oladiran, Awodugba Ayodeji; Oluwaseun, Adedokun; Kolawole, Sanusi Yekinni // International Journal of Research & Reviews in Applied Sciences;Sep2012, Vol. 12 Issue 3, p420 

    Optimal homogenous cadmium sulfide film was synthesized by chemical bath deposition (CBD) technique using a bath containing cadmium chloride, ammonium chloride, ammonium hydroxide and thiourea. The film was characterized by optical absorption, X-ray diffraction and scanning electron microscope...

  • Spontaneous buildup of surface potential with a thin film of a zwitterionic molecule giving noncentrosymmetric crystal structure. Tsutsumi, Jun’ya; Yoshida, Hiroyuki; Murdey, Richard; Sato, Naoki // Applied Physics Letters;11/2/2009, Vol. 95 Issue 18, p182901 

    Surface potentials were examined using the Kelvin method for thin films of zwitterionic molecules, pyridinium 1,3-dihydro-1,3-dioxo-2H-inden-2-ylide (PI or IPB) and two nitrogen-substituted derivatives. Spontaneous buildup of the surface potential on the film (5.5 V at a film thickness of 300...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics