Structural and ferroelectric studies of Bi[sub 3.44]La[sub 0.56]Ti[sub 3]O[sub 12] films

Tomar, M. S.; Melgarejo, R. E.; Hidalgo, A.; Mazumder, S. B.; Katiyar, R. S.
July 2003
Applied Physics Letters;7/14/2003, Vol. 83 Issue 2, p341
Academic Journal
Bi[SUB4-x]LaxTi[SUB3]O[SUB12] materials were synthesized by the sol-gel process and thin films were prepared on Pt (i.e., Pt/TiO[SUB2]/SiO[SUB2]/Si) substrate by spin coating. Structural properties of the films were examined by x-ray diffraction and Raman spectroscopy. Dielectric and ferroelectric response was studied for 0.63-mm-thick Bi[SUB3.44]La[SUB0.56]Ti[SUB3]O[SUB12] films. Butterfly dielectric behavior and remnant polarization of up to Pr541 mC/cm2has been achieved. These films also showed fatigue free response up to 10[SUP9]switching cycles. On the basis of these studies, large polarization in Bi[SUB3.44]La[SUB0.56]Ti[SUB3]O[SUB12] films is attributed to dipole formation which may tilt TiO[SUB6] octahedra to Bi[SUB2]O[SUB2] interlayer.


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