TITLE

Critical current density and resistivity of MgB[sub 2] films

AUTHOR(S)
Rowell, J. M.; Xu, S. Y.; Zeng, X. H.; Pogrebnyakov, A. V.; Li, Qi; Xi, X. X.; Redwing, J. M.; Tian, W.; Pan, Xiaoqing
PUB. DATE
July 2003
SOURCE
Applied Physics Letters;7/7/2003, Vol. 83 Issue 1, p102
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The high resistivity of many bulk and film samples of MgB[SUB2] is most readily explained by the suggestion that only a fraction of the cross-sectional area of the samples is effectively carrying current. Hence, the supercurrent (J[SUBc]) in such samples will be limited by the same area factor, arising) for example from porosity or from insulating oxides present at the grain boundaries. We suggest that a correlation should exist, J[SUBc]∞1/Δρ[SUB300-50 K], where Δρ[SUB300-50 K] is the change in the apparent resistivity from 300 to 50 K. We report measurements of ρ(T) and J[SUBc] for a number of films made by hybrid physical-chemical vapor deposition which demonstrate this correlation, although the "reduced effective area" argument alone is not sufficient. We suggest that this argument can also apply to many polycrystalline bulk and wire samples of MgB[SUB2].
ACCESSION #
10143749

 

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