Model of transport nonuniversality in thick-film resistors

Grimaldi, C.; Maeder, T.; Ryser, P.; Strässler, S.
July 2003
Applied Physics Letters;7/7/2003, Vol. 83 Issue 1, p189
Academic Journal
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as a consequence of wide distribution of interparticle tunneling distances.


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