TITLE

Model of transport nonuniversality in thick-film resistors

AUTHOR(S)
Grimaldi, C.; Maeder, T.; Ryser, P.; Strässler, S.
PUB. DATE
July 2003
SOURCE
Applied Physics Letters;7/7/2003, Vol. 83 Issue 1, p189
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as a consequence of wide distribution of interparticle tunneling distances.
ACCESSION #
10143718

 

Related Articles

  • Stress-dependent piezoresistivity of tunneling-percolation systems. Wang, Yansong; Zhang, Ligong; Fan, Yi; Jiang, Dapeng; An, Linan // Journal of Materials Science;Jun2009, Vol. 44 Issue 11, p2814 

    We studied the stress-dependent piezoresistive behavior of tunneling-percolation systems. Starting from percolation-like power law of resistivity, a model relating piezoresistive stress coefficient to the applied stress has been developed by considering the stress-induced changes in the critical...

  • Elastoresistance tensor components for thick-film resistors. Amin, Ahmed // Applied Physics Letters;4/1/1991, Vol. 58 Issue 13, p1446 

    Measures the longitudinal M[sub 11], transverse M[sub 12] and hydrostatic M[sub h] elastoresistance tensor components for thick-film resistors as a function of temperature. Analysis of the results in terms of the spherical and conical symmetry groups.

  • Resistors for Power Applications with Low Self Heating.  // Power Electronics Technology Exclusive Insight;12/12/2012, p7 

    The article offers information on the RHC2512, a thick film chip resistor to achieve low heat rise.

  • Gauge factor enhancement driven by heterogeneity in thick-film resistors. Grimaldi, C.; Ryser, P.; Stra¬®ssler, S. // Journal of Applied Physics;7/1/2001, Vol. 90 Issue 1, p322 

    We present a simple picture of the gauge factor (GF) enhancement in highly heterogeneous materials such as thick-film resistors. We show that when the conducting phase is stiffer than the insulating one, the local strains within the latter are enhanced with respect to the averaged macroscopic...

  • Gauge factor of thick-film resistor: Outcomes of the variable-range-hopping model. Grimaldi[a], C.; Ryser, P.; Strassler, S. // Journal of Applied Physics;10/1/2000, Vol. 88 Issue 7, p4164 

    Examines how a microscopic mechanism of transport affects the gauge factor (GF) of thick-film resistors. Qualitative results; Simple model for the GF temperature dependence.

  • Heat capacity of thick-film resistance thermometers below 1 K. Love, M. S.; Anderson, A. C. // Review of Scientific Instruments;Jun87, Vol. 58 Issue 6, p1113 

    Thick-film resistors, when used as thermometers below 1 K, have a heat capacity similar to that found in Matsushita carbon-composition resistors.

  • IrO[sub 2]-based thick-film resistors. Tankiewicz, S.; Morten, B.; Prudenziati, M.; Golonka, L. J. // Journal of Applied Physics;4/1/2002, Vol. 91 Issue 7, p4261 

    IrO[sub 2]-based thick-film resistors were prepared and their microstructure/electrical property relationship was studied as a function of the firing temperature T[sub f] and composition. The resistor microstructure exhibits a notable change, from a strongly segregated structure for T[sub f] =...

  • Determination of the thickness of Al[sub 2]O[sub 3] barriers in magnetic tunnel junctions. Buchanan, J. D. R.; Hase, T. P. A.; Tanner, B. K.; Hughes, N. D.; Hicken, R. J. // Applied Physics Letters;7/22/2002, Vol. 81 Issue 4, p751 

    The barrier thickness in magnetic spin-dependent tunnel junctions with Al[sub 2]O[sub 3] barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge oxidation time on the barrier...

  • Transmission electron microscopy structure and platinum-like temperature coefficient... Jiang, J.C.; Crosbie, Gary M. // Journal of Applied Physics;7/15/2000, Vol. 88 Issue 2, p1124 

    Discusses thick film resistors as an alternative to thin-film platinum temperature sensors. Resistance and resistivity; Transmission electron microscopy characterization; Microscopic composition and crystallography; Role of morphology on temperature coefficient resistance.

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics